Second Announcement
(last update: 22/11/2005)

IUVSTA Logo

43rd IUVSTA Workshop
on
"Chemical Sensitivity
in Scanning Probe Microscopy"

Zakopane 2005

VENUE:

The Workshop will take place in Hotel "Geovita", Zakopane, Poland

DATES:

November 29 - December 03, 2005

LOCATION:

Zakopane is situated in southern Poland, about 100 km to the south of Kraków. It is located in a valley at the foot of the Tatra mountains, the highest mountains in Poland (Mount Rysy 2499 m). The town center has elevation of about 840 m above sea level, but some parts are even as high as 1000 m above sea level on the slopes of Gubalówka - a hill that surrounds it from the north. Zakopane district is considered to be the most attractive tourist region in Poland. The Tatra mountains, the hilly villages of Podhale, as well as the town itself are ideal places for walks and longer or shorter hikes. At the beginning of December we expect a mild winter weather with some snow. For more information about Zakopane and the hotel see web pages:

A bus transport to Zakopane

The transportation from and to Krakow airport will be arranged by the Workshop organizers. There will be a bus starting from Krakow at 4 p.m. on Tuesday (November 29). The bus will wait in front of the back entrance to the Jagiellonian University Institute of Physics (Oleandry street).
There is available small (gif file, 436x457, 207kB) and big (gif file, 956x1002, 982kB) map of Zakopane with the Hotel "Geovita" location.
More information about the transportation will be soon available on-line.

ORGANIZER:

on behalf of the International Union for Vacuum Science, Technique and Applications (IUVSTA) the Workshop is organized by the Division of Nanotechnology and Nanostructures of the Polish Vacuum Society in cooperation with the Centre for Nanometer-scale Science and Advanced Materials NANOSAM at the Jagiellonian University.

PRINCIPAL THEMES/TOPICS:

Rapid developments in nanotechnology and science of nanostructured materials are prompting an urgent need for designing an analytical and nondestructive tool for chemical characterization of solid surfaces with ultimate (nanometer or possibly sub-nanometer) resolution. The overall objectives of the proposed workshop are focused on such developments in scanning probe microscopy and their applications to chemical sensing of various surfaces with extreme spatial resolution.

The workshop should provide a forum for scanning probe specialists in order to review recent theoretical and experimental advances in the relevant areas of research and set guidelines for future activities in the field.

The meeting is sponsored by the Surface Science Division of the International Union of Vacuum Science, Technique and Applications as the Union's 43rd Scientific Workshop.

WORKSHOP FORMAT:

The Workshop will consist of up to 12 invited lectures (30 minutes speaking time) and several oral contributions (20 minutes each). A single poster session will also be organized. The number of participants is limited to 80. The conference language is English. In agreement with the IUVSTA Workshop regulations no conference proceedings will be published.

WORKSHOP FEE:

The Workshop fee is 400 Euro (the student fee is reduced to 200 Euro) and it covers the cost of full board accommodation (in double room) from Nov. 29 (evening arrival) till Dec. 3 (afternoon departure), coffee breaks, social program (excursion and mountaineer folk dinner), book of abstracts, local transportation between Krakow and Zakopane, and administrative costs. An additional fee of 50 Euro will apply for participants who prefer single room accommodation.
The Workshop fee for accompanying person is 200 Euro and it covers the cost of full board accommodation (in double room), social program (excursion and mountaineer folk dinner) and local transportation between Krakow and Zakopane.

REGISTRATION:

You are welcome to fill the on-line Final Registration Form on the WWW Page: http://confer.uj.edu.pl/IUVSTA_Workshop/regform.html
The deadline for the final registration and all payments is on October 30, 2005.

ABSTRACT SUBMISSION:

The abstract submission is now opened. The instructions for abstract submission are specified below.

Abstracts should be prepared as a MS Word or RTF (Rich Text Format) document not longer than one page, written as specified below, and sent as an attachment via e-mail with the subject line: "IUVSTA ABSTRACT name of the presenter - consecutive number of the abstract (if more than 1 is submitted by the same presenter)" to the e-mail address pawel@surf.if.uj.edu.pl before November 10, 2005 (extended abstract submission deadline!)

In the mail message body please specify the preferred format of the presentation (just put the word "oral" or "poster").

Each abstract must be sent as a separate message!

Please do not send duplicate submissions!

Specifications for abstract submission as the MS Word or RTF file are following:

  • Use a Times (Times New Roman) 12 pts character set with one and a half line spacing.
  • Type the title in CAPITAL LETTERS, single spaced, aligned to the left.
  • Then put an empty line.
  • Specify the authors' names with initials, using both upper and lower case. Type the presenting author name using bold characters.
  • Use a new line for short affiliation(s) and addresses.
  • Again a blank line.
  • Then put the abstract body. The text should be justified left and right. Do not indent first lines of paragraphs. Put numbers of the references (not more than 5) between square brackets. Remember please, that the total length of the abstract (including title, authors, affiliations and references) should not exceed one page.
  • Use a new line for references. Each one should contain: reference number in square brackets, author(s) with initials, journal name, volume number, year in parentheses, followed by the number of the first page.
  • Below the abstract body put a blank line and in the new line specify again the following information:
    consecutive abstract number (if more then one is submitted), and preferred format of the presentation (word "oral" or "poster").

DEADLINES:
New extended deadlines!

  • Abstract submission (extended): November 10, 2005;
  • Final registration and payment (extended): November 15, 2005.

INTERNATIONAL STEERING COMMITTEE:

Prof. Ernst Meyer Universitaet Basel, Switzerland
Prof. Ruben Perez Universidad Autónoma de Madrid, Spain
Prof. Peter Varga TU Vien, Austria
Prof. Marek Szymonski
Chair 		Institute of Physics, Jagiellonian University,
(ul. Reymonta 4, 30-059 Krakow, Poland;
phone: +48 506006545; e-mail: ufszymon@cyf-kr.edu.pl)

INVITED SPEAKERS

1) Oscar Custance (Osaka University, Japan) - "Toward Atomic Chemical Identification and Artificial Nanostructuring Using Atomic Force Microscopy";

2) Adam Foster (Helsinki University of Technology, Finland) - "Chemistry and Chemical Sensitivity in Scanning Force Microscopy";

3) Toyoaki Eguchi (Augsburg University, Germany) - "Local Spectroscopy and Atomic Imaging with a Quartz Sensor";

4) Yukio Hasegawa (The University of Tokyo, Japan) - "Sensing Charge Transfer among Surface Atoms by Kelvin Probe Force Microscopy";

5) Lev Kantorovitch (Kings College London, United Kingdom) - "Species Recognition in Non-Contact AFM Experiments";

6) Franciszek Krok (Jagiellonian University, Krakow, Poland) - "Kelvin Probe Force Microscopy of Thin Ion Crystal Films Grown on Compound Semiconductor Surfaces";

7) Christian Loppacher (University of Technology Dresden, Germany) - "Chemical Contrast On The Nanometer Scale Obtained By Kelvin Probe Force Microscopy";

8) Karl-Heinz Rieder (Free University Berlin, Germany) - "Can Atomic and Molecular STM-manipulation Lead to Chemical Resolution?";

9) Yossi Rosenwaks (Tel Aviv University, Israel) - "Local Measurement of Density of States in Inorganic and Organic Semiconductors using Kelvin Probe Force Microscopy";

10) Sascha Sadewasser (Hahn-Meitner-Institut, Germany) - "Resonance Enhanced Kelvin Probe Force Microscopy for Semiconductor Characterization on the Nano-Scale";

11) Alexander Shluger (University College London, U.K.) - "Using Surface Defects to Aid Tip and Surface Characterisation";

12) Ivan Stich (University of Technology, Bratislava, Slovak Republic) - "Chemical Resolution and Nanomanipulation with Dynamic AFM";

WORKSHOP PROGRAM SCHEDULE:

Tuesday, Nov. 29, 2005
18:00 - arrival in Zakopane, "Geovita" hotel
19:00 - welcome reception
Wednesday, Nov. 30, 2005
09:00 - 13:00 - oral presentations
13:30 - 14:30 - lunch
15:00 - 17:30 - oral presentations
18:00 - 19:00 - dinner
19:30 - 21:00 - poster session
Thursday, Dec. 01, 2005
09:00 - 13:00 - oral presentations
13:30 - 14:30 - lunch
15:00 - 18:00 - oral presentations
19:00 - 22:00 - Workshop dinner
Friday, Dec. 02, 2005
09:00 - 13:00 - outing
13:30 - 14:30 - lunch
15:00 - 18:00 - oral presentations
Saturday, Dec. 03, 2005
09:00 - 13:00 - oral presentations
13:00 - closing
13:30 - 14:30 - lunch
15:00 - departures

SPONSORS:

  • IUVSTA (International Union for Vacuum Science, Technique and Applications) - the main sponsor,
  • Polish Vacuum Society (PTP),
  • Polish Ministry of Research and Information Technology,
  • Jagiellonian University.

Some addresses:

Workshop WWW Page: http://confer.uj.edu.pl/IUVSTA_Workshop/
E-mail: ufszymon@cyf-kr.edu.pl
Office phone: (+48 12) 663 55 60
Cell phone: +48 506 006 545
Fax: (+48 12) 633 70 86
Postal address: Prof. Marek Szymonski
Institute of Physics
Jagiellonian University
ul. Reymonta 4
30-059 Kraków
Poland


Maintained by: Pawel Czuba
last update: November 22, 2005
e-mail: pawel@surf.if.uj.edu.pl

 
Last update: 22/11/2005